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样品室高感度 camera：
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| SEM-Chamberscopes |
It is impossible to monitor the position of the detector relative to the specimens or vice versa, inside the SEM when it is in operation, something that is vital not only to achieve the best possible results, but also to prevent damage to expensive equipment. Surveillance equipment is therefore essential in the form of 'in-chamber' cameras. K.E. Developments has a range of 'chamberscope' cameras for use with most makes of SEM, which use low levels of infra red illumination not normally detected by the SEM detector, thereby allowing simultaneous operation. |
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| Infrared Chamberscope 20/20 |
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Designed to fit virtually anywhere inside the chamber utilizing very small access ports. It permits viewing where obstructions do not allow the use of in line or other camera systems.
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| Infrared Chamberscope GW |
| This Test Sample is produced so that performance of Backscattered Detectors may be verified. In addition, the test sample includes 4 adjacent elemental pairs evenly spaced with atomic number differences of 1Z. These may also be used to verify the performance or act as a quantitative references. |
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The system is intended for continuous monitoring of the inside of the SEM’s specimen chamber. This new, entry level design offers a compact low profile camera and IR illumination assembly to minimize conflict with other accessories. |
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| Infrared Chamberscope STD |
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Designed to be mounted through a port on the outer surface of the chamber, this camera offers continuous monitoring of the chamber interior.
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| Infrared Miniscope 25 |
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This is the counterpart of the infrared chamberscope, in that it is also mounted through a port on the external surface of the chamber. However, it has an ultra-compact design. |
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| Infrared Zoomscope |
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Also designed to be mounted via an external port, this camera is mounted at a high angle with a 10:1 zoom facility allowing either a general chamber view or close scrutiny of the sample. |
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| Infrared Peeperscope |
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This is designed to provide a close up view of the specimen surface. It is used to optically locate areas of interest and relate these to the scanned area. Its use considerably speeds up specimen analysis, particularly when observing semiconductors or the larger EDX or WDX specimens. |
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| TFT LCD Monitor |
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The 10.4 inch TFT LCD Monitor is designed with the operator in mind. This mid size unit has been specially manufactured to give an increased view and allow more detailed perception of the chamber, with the additional advantage of a small footprint so as to not to take up valuable space on the control top area of the SEM itself. |
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